XRA-003

XRF

NanoMaterials Facility

MAKE

SPECTRO

MODEL

XEPOS III

LOCATION

G27 LISE

X-rays excite the atoms of the sample to emit radiation. This radiation is measured by a semiconductor detector. To achieve a higher sensitivity, the exciting radiation can be optimized by using targets. The unit is delivered including a prepared analysis method. Data are already stored in the unit’s memory. The measured values are compared with these data. After the measurement is complete, the results relating to an unknown sample are displayed on the screen. The sample material can be solid, liquid or a powder.

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