XRA-008

Thermo Scientific K-Alpha+ XPS

NanoMaterials Facility

MAKE

Thermo Scientific

MODEL

K-Alpha+

LOCATION

G27 LISE

System is identical to the old K-Alpha model except the ion gun has dual sputtering mode. Sputtering can be done either using monatomic source for standard material or cluster source for polymer and organic material.

* Analyzer: 180ยฐ double focusing hemispherical analyzer with 128-channel detector
* X-ray source: Al k-alpha micro-focused monochromator with variable spot size (30-400ยตm in 5ยตm steps)
* Ion Gun: Energy range 200-4000eV (monatomic), 2000-8000eV (cluster)
* Charge Compensation: Dual beam source and ultra-low energy electron beam
* Sample Handling: 4-axis sample stage (60 x 60mm sample area, 20mm maximum sample thickness)
* Vacuum System: 2x 220 l/s turbo molecular pumps for entry & analysis chambers
* Data-system: Avantage data system
* Options: tilt module for ARXPS
* Options: biasing module for work function measurement

Contact staff for training information.

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