HAR-039

NanoMill 1040

Imaging and Analysis

MAKE

Fischione

MODEL

1040

LOCATION

B15A LISE

This ultra-low-energy, concentrated ion beam is used to remove near-surface damage and carbon contamination from TEM specimens. Its high precision argon ion beam is capable of post-FIB (focused ion beam) processing and conventional specimen preparation.

High precision Ar Ion mill for TEM sample prepartaion.

Contact staff for training information.

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