JEOL ARM 200F STEM
Imaging and Analysis
This ultra-high resolution analytical scanning transmission electron microscope (STEM) has a cold field emission gun (FEG) and integrated aberration (Cs) corrector. It is equipped with bright field (BF), annular dark field (ADF), energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) detectors. This STEM achieves a HAADF STEM resolution of 78 picometers at 200kV and energy resolution of 0.33eV at 200kV.