TEM-11

JEOL ARM 200F STEM

Imaging and Analysis

MAKE

JEOL

MODEL

ARM 200F

LOCATION

B15B LISE

This ultra-high resolution analytical scanning transmission electron microscope (STEM) has a cold field emission gun (FEG) and integrated aberration (Cs) corrector. It is equipped with bright field (BF), annular dark field (ADF), energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) detectors. This STEM achieves a HAADF STEM resolution of 78 picometers at 200kV and energy resolution of 0.33eV at 200kV.

Training is available for advanced TEM users, who have demonstrated their capabilities on our other TEMs. This instrument is not suitable for novice users.

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