HAR-001

JEOL 2010 FEG - TEM/STEM

Imaging and Analysis

MAKE

JEOL

MODEL

2010

LOCATION

B15G LISE

The JEOL TEM/STEM is a field emission transmission electron microscope for imaging solid materials that can perform high resolution lattice imaging in TEM mode or annular-dark field (ADF) imaging in STEM (scanning) mode. An Energy Dispersive X-ray Spectroscopy (EDS) detector is available for both point and mapping modes. A side-mounted diffraction camera can be used to obtain diffraction patterns without a beam stop. Lattice resolution is 0.19nm pt-to-pt in TEM mode and STEM probe resolution is 0.2nm. This instrument can be used at 200kV, 120kV, 80kV and 60kV.

Users must complete training on the JEOL 2100 before they are eligible for training on the JEOL 2010F.

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