Hall Effect Measurement System
The MMR Hall and Van der Pauw Measurement System can be used to analyze the electrical properties of semiconducting films in the temperature range of 80K-730K (-190°C- 455°C) with a variable magnetic field up to 1.4 Tesla (14,000 G). The system is designed for samples up to 10×10 mm in size with probe/contact configurations consisting of 2.5, 5, and 7.5 mm center to center spacing. The source/meter is capable of supplying current from 1 pA to 10 mA and Vmax= 2.3V. The system reports: resistivity, sheet resistance, majority carrier type and concentration, mobility, and Hall coefficient as a function of temperature with a user friendly software package.