CE-3

4156c Seminconductor Analyzer No 2

Nanofabrication Facility

MAKE

Agilent

MODEL

4156c

LOCATION

G27 LISE

Agilent 4156c semiconductor parameter analyzer for device and thin film electrical characterization on PB-2, MET-5, or MET-19 located in LISE G27

Contact staff for training information.

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